Scheduled for Thursday, April 12, 1 – 4 PM and is included in your registration fee.  Workshop #1  Sample Preparation Techniques for Materials Science – Choosing the Right Method 1-3pm, Hillel Room, 3rd floor BLUU    Robert Ranner, Product Manager, Leica Applications Specialist    Quality preparation is the key to quality analysis. Reducing artifacts prior to observation is crucial. This workshop is designed to offer researchers an insight into the right method for preparing material samples prior to TEM, SEM and AFM observation using the ion beam milling and ultrasectioning techniques. Topics: Etching, ion beam milling, slope cutting  – what’s the difference? Target surface preparation – getting it down to size Ultrasectioning – why go cryo?  Each participant will receive a DVD covering workshop topics and lecture papers presented during the session.     Hands-on demonstration will be available with the following equipment: TXP – multi-functional target preparation device which can saw, mill, grind and polish TIC3X – automated ion beam milling system UC7/FC7 – advanced room and cryo temperature ultramicrotome Prepared samples will be viewed on an TM-3000 table top SEM    Worskshop #2   How to take care of your microscope as well as obtain the best images 2-4 pm, Clinkscale Room, 3rd floor BLUU   Rod Baird, McBain Microscopy Systems